Free Keithley Webinar Demonstrates Methods and Techniques for Maximizing Low Current Measurements

Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free webinar titled "How to Get the Most from Your Low Current Measurement Instruments" on Thursday, November 19, 2009. This one-hour web-based seminar will discuss the basics of low current (from n/A to fA) electrical measurements, including how to select the best current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise. To register for this event, visit www.keithley.com/events/semconfs/webseminars.

Those who participate in this seminar will learn and understand:

• Measurement techniques required for measuring very small currents
• Sources of measurement error that will affect such low current measurements
• Measurement solutions that can be used in low current measurement applications

These measurement best practices are important for applications in semiconductor material/device characterization, nanoscience test and measurement, optoelectronic device characterization, and many more. Applications examples where such sensitive measurements are required will be discussed, together with a discussion of recent innovative test equipment solutions.

"How to Get the Most from Your Low Current Measurement Instruments” is recommended for researchers, engineers, and scientists in areas such as materials science, chemistry, nanoscience, and semiconductor device development who wish to get a better understanding of low current electrical measurements.

Presenter Jonathan Tucker is the senior marketer for Keithley’s research and education business and sensitive measurements product line manager. He joined Keithley in 1987 and has held numerous positions. Tucker holds a Bachelor of Electrical Engineering degree from Cleveland State University and an MBA from Kent State University.

"How to Get the Most from Your Low Current Measurement Instruments" will be broadcast on Thursday, November 19, 2009, at 3:00 p.m. Central European Time (CET) (9:00 a.m. Eastern Standard Time (EST)) for the European audience and at 2:00 p.m. EST (8:00 p.m. CET) for the North American audience. The event is free to the public, but advance registration is required at www.keithley.com/events/semconfs/webseminars. The webinar also will be archived on Keithley's website for those unable to attend the original broadcast.

For more Information.

For more information on Keithley Instruments or any of its measurement solutions, please visit www.keithley.com or contact the company.

About Keithley Instruments, Inc.

With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.