Keithley
Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical
test instruments and systems, has sponsored the premier issue of Project
TEST, in cooperation with Electronic
Products magazine and the Hearst Electronics Group. To read Project
TEST, a unique 32-page electronic magazine edited for test and
measurement engineers, visit http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php.
As the sponsor of the first issue, Keithley authors contributed a number
of articles, including "Fundamentals of Semiconductor C-V
Measurements,” "Design Considerations for Maximizing Throughput and
Accuracy in Switch/Measure
Instrumentation,” "Trends in RF
Testing,” and "Taking the Measure of Pulse
Generators.” Other features of the premier issue include a viewpoint
on "Real Innovation in Instrument Connectivity,” and an article on
"Solutions for Testing MEMS Devices at the Wafer Level” from SUSS
Microtech Test Systems.
Project TEST also provides access to a number of unique resources
no print magazine can reproduce, including video product presentations,
an interactive guide to digital
multimeters, and an Electronic Products test and measurement
news feed.
For More Information.
To read Project TEST, visit http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php.
For more information on Keithley or any of its test solutions, visit www.keithley.com
or contact the company at:
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Telephone:
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800-688-9951 440-248-0400
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FAX:
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440-248-6168
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E-mail:
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publisher@keithley.com
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Internet:
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www.keithley.com
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Address:
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Keithley Instruments, Inc.
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28775 Aurora Road
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Cleveland, OH 44139-1891
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About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments
has become a world leader in advanced electrical test instruments and
systems from DC to RF (radio frequency). Our customers are scientists
and engineers in the worldwide electronics industry involved with
advanced materials research, semiconductor device development and
fabrication, and the production of end products such as portable
wireless devices. The value we provide them is a combination of products
for their critical measurement needs and a rich understanding of their
applications to improve the quality of their products and reduce their
cost of test.
Products and company names listed are trademarks or trade names of their
respective companies.